X-raying the geometric precision error of DEMs with Fourier analysis

In a previous post I mentioned a way of Fourier analyzing the geometric precision error of DEMs. Today I realized that the scheme I proposed can only account for part of the error signal. The approach I proposed is correct but it can only capture one particular aspect of the total error. The simplest way of seeing this is to consider the $S_2$ symmetry group. This would be the one to use for $p=2$ photographs. From two photographs I can produce two DEMs: $A \rightarrow B$ and $B \rightarrow A$. The covariance matrix for these two DEMS would be a 2×2 covariance matrix of the form:
$$\left( \array{ a \; b \\ b \; c} \right).$$
But the representation induced by $S_2$ on these two DEMs generates the matrices:
$$\left( \array{ 1 \; 0 \\ 0 \; 1} \right) \text{and} \left( \array{ 0 \; 1\\ 1 \; 0} \right)$$
These two matrices cannot capture the three independent degrees of freedom in the 2×2 covariance matrix. Therefore, the induced representation cannot capture all of the possible errors that are observed when two photograps are used to produce two maps. But the representation would allow you to project out that component of the error that is explained by permutations of the images.

You would need at least $p=7$ photograps to have enough members in $S_p$ to completely model the variation in the DEMs observed when you use two photographs to produce a map. To understand the error that cannot be explained by the permutation group you would need to use three photographs to create a DEM. For $p$ photographs this would create $p*(p-1)*(p-2)$ DEMs. Since we can produce as much or even more than $p!$ DEMs from $p$ photographs, at some point we will always overwhelm the representational power of the symmetry group of $p$ objects (in this case, $p$ photographs). What error remains after we project out the component that can be modelled by $S_n$? I hypothesize that it would be error that can be further Fourier analyzed by using the symmetry group associated with the orientation and positions of the cameras. These parameters are themselves error prone and would, by virtue of their geometry, only induce certain error patterns.

This viewpoint of the errors would therefore view the observed error as one that can be captured by a succesive series of symmetry groups. One component would be that related to the finite group of $S_p$. Another component would be that one induced by translations and rotations of the camera positions and orientations. Like any real theory of errors, this approach would only peel away layers of error — always remaining would be a nugget of error that would require more and more complex models to decompose. The second law of thermodynamics is not violated!

The metaphor to x-raying in the title of this post comes from using Fourier analysis to study X-ray diffraction photographs by crystals. Crystals induce a certain periodicity on the scattered X-rays even when the sample is crushed into a powder. In other words, the randomly scattered blocks of crystal in the powder individually send a perfect difraction pattern. But the X-ray photograph records the mismash of the signals — the picture is blurry. Nonetheless, the bluriness has a symmetry component that comes from the periodic structure of the crystals and therefore Fourier analysis is able to pick the symmetry in the x-ray caused by the crystal periodicity. The Fourier decompositions for geometric errors are doing the same thing. There are many sources of errors in DEMs from aerial photographs. Some come from the fact that you used individual photographs to create the maps. This component of the error can therefore be accounted by studying representations of the symmetry group of p objects. Others come from uncertainty in the position or orientation of the camera when it took the photograph. These are explained by induced representations of non-abelian Lie groups like 3-D rotations in the space of covariance matrices.